ISSTT Proceedings

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Investigation of Surface Profiles of a Reflector from Near-field Beam Measurements

Authors:
M.T. Chen, C.E. Tong
Abstract:
We have investigated a technique to map out surface defects of a reflector from near-field vector measurements. In our experiment a near-field range is set up to measure the beam reflected from a test surface at 240 GHz. A full-wave numerical method based on a vectorial Green's function is implemented to project the measured beam profile onto the mirror's surface. We then examine the differential phase pattern constructed from two separate scans, one with a known artifact and another without, to reveal features due to the artifact. Our experiments demonstrate that resolution down to a few degrees in phase can be obtained with this method.
Categories:
Optics
Year:
1997
Session:
9
Full-text:
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Page Number(s):
437-445