ISSTT Proceedings

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Optical Qualification of the Normal Metal Hot-Electron Microbolometer (NHEB)

Authors:
Denis Chouvaev, Daniel Sandgren, Michael Tarasov, Leonid Kuzmin
Abstract:
We are presenting here the first results of optical responsivity measurements for the Normal Metal Hot-electron Microbolometer (NHEB), a hot-electron direct detector for sub-mm wavelengths. The detector is a metallic microresistor coupled to a planar antenna; superconductor-insulator-normal metal (SIN/NIS) tunnel junctions are employed to monitor the temperature of the electron gas. We aim to achieve with this detector sensitivity around 10-17 W/[square root]Hz at 0.3 K while the time constant is going to be less than 1 µs. Planar design of the NHEB is favorable for its future expansion into a detector array. Earlier we have measured electrical NEP (noise equivalent power) of 3×10-16 W/[square root]Hz for an NHEB at 0.3 K. This time we have performed an optical responsivity measurement for another NHEB at 0.5 K using a hot/cold load. We have obtained an optical responsivity value consistent with the electrical responsivity data, and with the estimated efficiency of the quasioptical coupling.
Categories:
Detectors
Year:
2001
Session:
10
Full-text:
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Page Number(s):
446-456